Download EBOOK Frontiers of Characterization and Metrology for Nanoelectronics PDF for free


Download EBOOK Frontiers of Characterization and Metrology for Nanoelectronics PDF for free Category: Technology & Engineering
The author of the book: Erik M. Secula
Format files: PDF, EPUB, TXT, DOCX
The size of the: 399 KB
Language: English
ISBN-13: 9780735407121
Edition: American Institute of Physics
Date of issue: 28 February 2010

Description of the book "Frontiers of Characterization and Metrology for Nanoelectronics":

As the semiconductor industry continues to move toward silicon nanoelectronics and beyond, the introduction of new materials, innovative processing and assembly, and novel devices brings formidable metrology challenges. We have entered an era where nanotechnology is required to meet the demand for smaller, faster, cheaper, and more complex functional chips. Innovative metrology and characterization methods have become critical. This book emphasizes the frontiers of innovation in the characterization and metrology needed to advance nanoelectronics. It comprises applications in nanoelectronic materials and devices, research and development, and manufacturing and diagnostics. Novel characterization methods for beyond CMOS and extreme CMOS devices PDF are addressed, as well as electrical measurements, interconnects, patterning, microscopy, and modeling. The Editors believe that this book of collected papers from world-class leaders provides a basis and effective portrayal of the industry s characterization and metrology needs and how they are being addressed by industry, academia, and government to continue the dramatic progress in semiconductors into the nanoelectronic regime. It also provides a foundation for stimulating further advances in metrology and new ideas for research and development.

Download EBOOK Frontiers of Characterization and Metrology for Nanoelectronics PDF for free


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Erik M. Secula

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Download EBOOK Frontiers of Characterization and Metrology for Nanoelectronics PDF for free



Download EBOOK Frontiers of Characterization and Metrology for Nanoelectronics for free

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